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Precision Ferroelectric and Multiferroic Testers

 

Unmatched Performance and Flexibility

 
 
Radiant’s Precision line of materials testers are designed with unmatched performance and flexibility. The Precision tester architecture supports the widest performance envelope, the most versatile test software and the highest signal-to-noise ratio of Ferroelectric and Multiferroic Test Systems on the market.
 
Radiant's test systems characterize individual material properties of dielectric response, remanent polarization, piezoelectricity, pyroelectricity, magnetoelectricity, and electrical leakage with no configuration change.   
 
Radiant offers a variety of Precision Test System (entry level systems, process monitoring, reliability testing, and production line testing) configurations to accommodate all levels of research.   Vision Data Acquisition Software (included with each Precision Test System) is a revolutionary software package that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment.  The type of tester determines the range of voltages, frequencies and sample sizes that Vision may characterize with that tester.
 
Radiant's Precision Test Systems save an average of 40% on research and development costs by providing advanced measuring systems with automated software that requires no configuration changes.  Complete packages are provided for Ferroelectric, Multiferroic, Piezoelectric, Thermal, Reliability, and Transistor Testing.
 

Precision Tester Line Comparison Chart

 

Tester Parameter

Multiferroic II

 

Premier

 

LC II

RT66C

  Voltage Range (built-in drive voltage)

±10V, ±30V, ±100V, ±200V or ±500V built-in

±200V

  Voltage Range with an external amplifier and high voltage interface (HVI)

10KV

 

10KV

 

10KV

10KV

  Number of ADC Bits

18

18

18

14

  Minimum Charge Resolution

0.80fC

 

0.80fC

 

<10fC

122fC

  Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2)

0.080μ2

0.080μ2

<1μ2

12.2μ2

  Maximum Charge Resolution

5.26mC

 

5.26mC

 

276μC

4.8μC

  Maximum Area Resolution (assuming saturation polarization =
100μC/cm
2)

52.6cm2

52.6cm2

2.76cm2

4.8mm2

  Maximum Charge Resolution with High Voltage Interface (HVI)

526mC

 

526mC

 

27.6mC

480μC

  Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI

>100cm2

>100cm2

>100cm2

4.8cm2

  Maximum Hysteresis Frequency

270KHz @ 10V

 

250KHz @ 10V

 

5KHz @ 10V

1KHz

 

270KHz @ 30V

 

50KHz @ 30V

 

5KHz @ 30V

 

 

270KHz @ 100V

 

50KHz @ 100V

 

5KHz @ 100V

 

 

100KHz @ 200V

 

50KHz @ 200V

 

5KHz @ 200V

 

 

5KHz @ 500V

2KHz @ 500V

2KHz @ 500V

 

  Minimum Hysteresis Frequency

0.03Hz

0.03Hz

0.03Hz

1/8th Hz

  Minimum Pulse Width

0.5μs

 

0.5μs

 

50μs

500μs

  Minimum Pulse Rise Time (5V)

400ns

400ns

40μs

500μs

  Maximum Pulse Width

1s

 

1s

 

1s

100ms

  Maximum Delay between Pulses

40ks

40ks

40ks

40ks

  Internal Clock

25ns

 

25ns

 

25ns

50μs

Minimum Leakage Current (assuming max current integration period = 1 seconds)

2pA

2pA

2pA

10pA

  Maximum Small Signal Cap Frequency

1MHz

 

1MHz

 

20KHz

2KHz

  Minimum Small Signal Cap Frequency

1Hz

1Hz

1Hz

10Hz

  Output Rise Time Control

10scaling

 

10scaling

 

10scaling

2 settings

  Input Capacitance

-6fF

-6fF

-6fF

1pF

  Electrometer Input All Test Frequencies for all test at any speed

Yes

 

Yes

 

Yes

Yes

* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.
 

Thousands of Test Systems Installed Worldwide
Distinguished World-Wide Users of Radiant’s Ferroelectric Test Systems

 


USA

Dr David Payne - Emeritus Professor of Materials Science and Engineering Department of Materials Science and Engineering

Dr Chang Beom Eom - College of Engineering University of Madison-Wisconsin

Dr. R. Ramesh Professor - Condensed Matter Experiment and Materials Science & Engineering University of Berkley

Dr. Ali Sayir program manager of High Temperature Aerospace Materials at the Air Force Office of Scientific Research NASA Glenn Research Center

Dr. RK Pandey - Ingram Endowed Professor Ingram School of Engineering Department of Physics Texas State University
 
 

Asia/Middle East

Dr. Husam N. Alshareef, - Associate Professor |Materials Science & Engineering Abdullah University of Science & Technology Saudi Arabia

Tsinghua University- Pro. Li Longtu

Harbin university of Science and Technology- Pro. Fei Weidong

University of Science and Technology of China- Pro. Chen Xianhui

Nanjing university- Pro. Song You

Zhongshan university- Pro. Bao Dinghua

Europe

Dr. Andrew Bell - BSc, Birmingham, PhD, Leeds, CEng, FIMMM Director of IMR and Professor of Electronic Materials

Dr. James Scott - Nanoscience Centre University of Cambridge
 

India

Prof. C.N.R.Rao / Dr. A.Sundaresan Jawarhar Lal Nehru Centre for Advanced Scientific Research,

Prof. S.B.Krupanidhi Materials Research Centre, Indian Institute of Science,

Prof. R.N.P.Chadhury Dept. of Physics & Meteorology, Indian Institute of Technology,

Prof. Dhananjai Pandey School of Marerials Science & Technology, Institute of Technology,

Banaras Hindu University,

Dr. Surya Mohan Gupta Laser Materials Division, Raja Ramana Centre for Advance Technology,

Dr. Ratnamala Chatterjee Department of Physics Indian Institute of Technology Delhi
 
Latin America
 
Prof. Koduri Ramam Nanocomposite Lab, Departamento Ingenieria de Materiales Facultad de Ingenieria
Universidad de Concepcion, Concepciion, Chile
 
 
Dr. Koduri Venkata Surya Ramam, Nanocomposite Lab, Departamento  Ingeniería de Materiales, Facultad de Ingeniería, Universidad de Concepcion, Concepcion, Chile, ramamk@udec.cl
 

Dr. Bhagavathula Subrahmanya Diwakar, Chile 

E-mail: bsd2020@gmail.com

 
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