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Pioneering Ferroelectric Test Systems

 
Radiant pioneered the development of the first ferroelectric test system in 1988. Radiant continues to develop cutting edge testers that are designed unlike any other test instruments in the world. With over 25 years of experience Radiant test systems save an average of 40% on research and development costs by providing advanced measuring systems with automated software that require no configuration changes.
 
All units are supplied with Radiant Technologies, Inc AB ferroelectric reference capacitors for easy access to tutorials and training on ferroelectric material physics and behavior. 
 

Comparison Chart

 

 

Voltage Options

Max Hysteresis Frequency

Min Hysteresis Frequency

Max Pulse Width

Minimum Pulse Rise Time (5V)

Multiferroic

±10V,±100V, ±200V,4kV,10kV

 
100KHZ @9.9V

30KHZ @200V

50KHz @100V

 

0.03Hz

1s

400ns

 Premier II

±10V,±100V, ±200V,4kV,10kV

 
100KHZ @9.9V

5KHZ @200V

10KHz @100V
 

0.03Hz

1s

400ns

Precision LC

±10V,±100V, ±200V,4kV,10kV

2kHz

0.1Hz

1s

40μs

Rt66B

±10V, ±200V

4kV

0.2kHz

0.125Hz

100ms

500μs

FH

±8V or ±100V

1MHz @ 8V

200kHz @ 100V

100Hz

10ms

20ns @ 8V

3μs @ 100V

 

Distinguished World-Wide Users of Radiant’s Ferroelectric Test Systems

 

USA

Dr David Payne - Emeritus Professor of Materials Science and Engineering Department of Materials Science and Engineering

Dr Chang Beom Eom - College of Engineering University of Madison-Wisconsin

Dr. R. Ramesh Professor - Condensed Matter Experiment and Materials Science & Engineering University of Berkley

Dr. Ali Sayir program manager of High Temperature Aerospace Materials at the Air Force Office of Scientific Research NASA Glenn Research Center

Dr. RK Pandey - Ingram Endowed Professor Ingram School of Engineering Department of Physics Texas State University

Asia/Middle East

Dr. Husam N. Alshareef, - Associate Professor |Materials Science & Engineering Abdullah University of Science & Technology Saudi Arabia

Tsinghua University- Pro. Li Longtu

Harbin university of Science and Technology- Pro. Fei Weidong

University of Science and Technology of China- Pro. Chen Xianhui

Nanjing university- Pro. Song You

Zhongshan university- Pro. Bao Dinghua

Europe

Dr. Andrew Bell - BSc, Birmingham, PhD, Leeds, CEng, FIMMM Director of IMR and Professor of Electronic Materials

Dr. James Scott - Nanoscience Centre University of Cambridge

India

Prof. C.N.R.Rao / Dr. A.Sundaresan Jawarhar Lal Nehru Centre for Advanced Scientific Research,

Prof. S.B.Krupanidhi Materials Research Centre, Indian Institute of Science,

Prof. R.N.P.Chadhury Dept. of Physics & Meteorology, Indian Institute of Technology,

Prof. Dhananjai Pandey School of Marerials Science & Technology, Institute of Technology,

Banaras Hindu University,

Dr. Surya Mohan Gupta Laser Materials Division, Raja Ramana Centre for Advance Technology,

Dr. Ratnamala Chatterjee Department of Physics Indian Institute of Technology Delhi

 

Applications

 
Thin/Bulk Films
MEM's
Sensors/Accuactors
 
Test Systems Measure individual material properties of:
  • Dielectric response
  • Remnant polarization
  • Piezoelectricity
  • Pyroelectric Measurement
  • Electrical Leakage

Tester Specification Comparison Chart

Distinguished World Wide Users of Radiant's Test Systems

Applications

Request for Quotation
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