Radiant provides pre-fabricated bottom electrodes and other services to assist the researchers to measure the piezoelectric coefficients of their films.
Accuracy and Uniformity
Radiant's Thin Film Piezoelectric Test Bundle accurately determines the e31, d31 and e33 coefficients for piezoelectric thin films with 2% reload uniformity. The Thin film Piezoelectric Test Bundle measures the piezoelectric coefficients of thin piezoelectric films deposited on cantilvers, voltages applied to the piezoelectric film will bend the substrate in various directions. The displacement is captured by the displacement sensor configured to capture the motion of the cantilever tip.
Radiant offers three versions of the Thin Film Piezoelectric Test Bundle:
1). With a photonic sensor for 72mm cantilevers (4")
2). With a photonic sensor for 72mm cantilevers (2")
Three types of measurements can be taken with the Thin Film Piezoelectric Test Bundle and a Radiant Precision Test System.
1). Determines cantilever tip displacement as a function of voltage.
2). The second type of test that can be executed is a direct d31 measurement. This is accomplished by forcing the cantilever tip to move while recording the charge generated by the piezoelectric capacitor as it is stressed.
3). Measures E33 if interdigitated electrodes are used.
No variance for re-loading same sample.
Simple to Operate
Thin film or bulk, production or research.
The Thin Film Piezoelectric Test Bundle will accommodate various sample geometries.
Measurements with the Thin Film Piezoelectric Test Bundle Include (but are not limited to):
micron with a range of 6mm. The Piezoelectric Displacement Sensor
analog output is calibrated to generate 5 microns/volt (or =0.2V/micron)
on the near side slope.
When the Piezoelectric Displacement
Sensor analog output is connected to a Precision Test System Sensor port
that output voltage is measured by an ADC whose resolution is 0.3mV per
Advanced Piezoelectric Software
piezoelectric software executes automated tests and provides clean
displacement measurements for thin piezoelectric films or piezoelectric
MEMs. The software can be congured for different measurements and
generate multiple plots at the touch of a button. It corrects multiple
measurements for test stand drift and then averages/smooths the
measurements to correct high and