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Precision Multiferroic II Ferroelectric Test System

 

Precision Multiferroic II Ferroelectric Test System

 
 

The Precision Multiferroic II Ferroelectric tester is the most advanced test system on the market.  The Multiferroic II has a unique frequency rating of 270KHz at +/-100V built-in to the system.    The Multiferroic II tester makes testing of  thin films  and bulk ceramics a fast and simple process.  

 

The Multiferroic II executes hysteresis, pulse, leakage, IV, and CV measurements without changing sample connections.  With the addition of extra fixtures, the Multiferroic II can measure pyroelectric properties, magnetoelectric properties, transistor characteristics, cryogenic properties, and bulk and/or thin film piezoelectric properties.  

  

The Precision Multiferroic II is offered with a variety of internal amplifiers.  The Multiferroic II is offered with a  ±100V, 200V and 500V built-in drive volt option.  The Multiferroic II can be expanded to 10kV with the addition of a high voltage interface and an amplifier.  Includes Vision Data Acquisition and Management System Software.

 

Precision Multiferroic II specifications include:
 
Tester Parameter

Multiferroic II

Voltage Range (built-in drive voltage) ±10V, ±30V, ±100V, ±200V or ±500V built-in
Voltage Range with an external amplifier and high voltage interface (HVI)

10KV

Number of ADC Bits

18

Minimum Charge Resolution

0.80fC

Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2)

0.080μ2

Maximum Charge Resolution

5.26mC

Maximum Area Resolution (assuming saturation polarization = 100μC/cm2)

52.6cm2

Maximum Charge Resolution with High Voltage Interface (HVI)

526mC

Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI

>100cm2

Maximum Hysteresis Frequency

270KHz @ 10V

 

270KHz @ 30V

 

270KHz @ 100V

 

100KHz @ 200V

 

5KHz @ 500V

Minimum Hysteresis Frequency

0.03Hz

Minimum Pulse Width

0.5μs

Minimum Pulse Rise Time (5V)

400ns

Maximum Pulse Width

1s

Maximum Delay between Pulses

40ks

Internal Clock

25ns

Minimum Leakage Current (assuming max current integration period = 1 seconds)

1pA

Maximum Small Signal Cap Frequency

1MHz

Minimum Small Signal Cap Frequency

1Hz

Output Rise Time Control

105 scaling

Input Capacitance

-6fF

Electrometer Input All Test Frequencies for all test at any speed

Yes

* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.
 

Includes Vision Data Aquistion Software

 
 
Radiant’s Precision Line of Test Systems are driven by Vision Software. Vision is a revolutionary software package that provides exceptional freedom to design, conduct, and review all procedures associated with any material experiment. The Vision test environment will collect all data acquired in a test sequence and organize it in archived data structures along with the test sequence definitions and data analysis tools. The experiment can always be recalled or  reproduced. Data and test conditions can be shared over the Internet to allow collaborative research.
 
 Measurements include, but are not limited to - Hysteresis, Leakage, Charge, Retain, Resist, I/V, Fatigue, C(V), PUND, Imprint, Leakage Current, Remnant Hysteresis, Small signal CV, imprint, retention, and piezoelectric displacement from one hardware configuration.  Radiant offers optional Piezoelectric, Magnetoelectric, Transistor, and Pyroelectric software programs
Documentation

Precision Multiferroic II Brochure

Vision Data Acquisition and Management System

Request for Quotation


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