The Most Advanced Test System on the Market

Meet the Precision Multiferroic II Ferroelectric Tester. It has a unique frequency rating of 270KHz at +/-100V built-in to the system. The Multiferroic II tester makes testing of thin films and bulk ceramics a fast and simple process. It captures 32,000 points at 2 MHz to achieve exquisite frequency resolution in DLTS or PAINT measurements.

The Precision Multiferroic II is offered with a variety of internal amplifiers. The Multiferroic II is offered with a ±100V, 200V and 500V built-in drive volt option. It can be expanded to 10kV with the addition of a high voltage interface and an amplifier.

Image of a Radiant Technologies Precision Multiferroic Ferroelectric Tester with a Radiant Technologies High Voltage Interface on top of it
Image of a Radiant Technologies Precision Multiferroic Ferroelectric Tester (bottom) and a Radiant Technologies High Voltage Interface (top)

The Precision Multiferroic II executes hysteresis, pulse, leakage, IV, and CV (and many other tasks) measurements without changing sample connections. With the addition of extra fixtures, the Precision Multiferroic II can measure pyroelectric properties, magneto-electric properties, transistor characteristics, cryogenic properties, bulk ceramic and/or thin film piezoelectric properties.

Tester Accessories

Tester accessories specifically used for the Precision Multiferroic II Ferroelectric Test System

Specifications

Voltage Range (built-in drive voltage) ±10V, ±30V, ±100V, ±200V or ±500V built-in
Voltage Range with an external amplifier and high voltage interface (HVI) 10KV
Number of ADC Bits 18
Minimum Area Resolution 0.80fC
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) 0.080μ2
Maximum Charge Resolution 5.26mC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) 52.6cm2
Maximum Charge Resolution with High Voltage Interface (HVI) 526mC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI >100cm2
Maximum Hysteresis Frequency 270KHz @ +/-100V
100KHz @ +/-200V
5KHz @+/- 500V
Minimum Hysteresis Frequency 0.03Hz
Minimum Pulse Width 0.5μs
Minimum Pulse Rise Time (5V) 400ns
Maximum Pulse Width 1s
Maximum Delay between Pulses 40ks
Internal Clock 25ns
Minimum Leakage Current (assuming max current integration period = 1 seconds) 1pA
Maximum Small Signal Cap Frequency 1MHz
Minimum Small Signal Cap Frequency 1Hz
Output Rise Time Control 105 scaling
Input Capacitance -6fF
Electrometer Input All Test Frequencies for all test at any speed Yes

* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.

Vision Data Acquisition & Management System Software Included

Vision dramatically increases the productivity of the researcher, reducing the time required to acquire data in an experiment. Vision’s enhanced productivity directly reduces cost of test. Vision dramatically increases the complexity of the research that may be accomplished by allowing researchers to combine different measurement tasks with environmental controls into an automated test procedure managed by programmable logic embedded with automated data collection, analysis and plotting tools.

Materials Testers running under the Vision Materials RDP Operating System reduces Cost of Test by a factor greater than 10 over any other ferroelectric tester.

  • A Library of 155 measurement, analysis, plotting, program control, and documentation tasks.
  • An Editor to arrange multiple tasks together from the Library into a Test Definition.
  • An Execution Engine to read and execute the Test Definition.
  • An amorphous database engine to Archive everything that happens in each Test Definition.

Radiant’s Precision Line of Test Systems are driven by Vision Software. Vision is a revolutionary software package that provides exceptional freedom to design, conduct, and review all procedures associated with any material experiment. The Vision test environment will collect all data acquired in a test sequence and organize it in archived data structures along with the test sequence definitions and data analysis tools. The experiment can always be recalled or reproduced. Data and test conditions can be shared over the Internet to allow collaborative research.

Measurements include, but are not limited to - Hysteresis, Leakage, Charge, Retain, Resist, I/V, Fatigue, C(V), PUND, Imprint, Leakage Current, Remnant Hysteresis, Small signal CV, imprint, retention, and piezoelectric displacement from one hardware configuration. Radiant offers optional Piezoelectric, Magnetoelectric, Transistor, and Pyroelectric software programs