Unmatched Performance, Accuracy & Flexibility
Radiant’s entire Precision Line of Materials Analyzers are designed with unmatched performance and flexibility. The Precision tester architecture supports the widest performance envelope, the most versatile test software and the highest signal-to-noise ratio of Ferroelectric and Multiferroic Test Systems on the market. Radiant's Test Systems characterize individual material properties of dielectric response, remanent polarization, piezoelectricity, pyroelectricity, magnetoelectricity, and electrical leakage with no configuration change.
Radiant offers a variety of Precision Test System (entry level systems, process monitoring, reliability testing, and production line testing) configurations to accommodate all levels of research. Vision Data Acquisition Software (included with each Precision Test System) is a revolutionary software package that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment. The type of tester determines the range of voltages, frequencies and sample sizes that Vision may characterize with that tester.
Vision Software offers 155 Tasks in Total. Vision is the only software package available for ferroelectric testers that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment. Vision dramatically increases the productivity of the researcher, reducing the time required to acquire data in an experiment. Vision’s enhanced productivity directly reduces cost of test. Vision dramatically increases the complexity of the research that may be accomplished by allowing researchers to combine different measurement tasks with environmental controls into an automated test procedure managed by programmable logic embedded with automated data collection, analysis and plotting tools.
Complete packages are provided for PiezoMEMS, Ferroelectric, Multiferroic, Piezoelectric, Thermal, Reliability, and Transistor Testing.
|Voltage Range (built-in drive voltage)||±10V, ±30V, ±100V, ±200V or ±500V built-in||±10V, ±30V, ±100V, ±200V or ±500V built-in||±10V, ±30V, ±100V, ±200V or ±500V built-in||±200V|
|Voltage Range with an external amplifier and high voltage interface (HVI)||10KV||10KV||10KV||10KV|
|Number of ADC Bits||18||18||18||14|
|Minimum Charge Resolution||0.80fC||0.80fC||<10fC||122fC|
|Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2)||0.080μ2||0.080μ2||<1μ2||12.2μ2|
|Maximum Charge Resolution||5.26mC||5.26mC||276μC||4.8μC|
|Maximum Area Resolution (assuming saturation polarization = 100μC/cm2)||52.6cm2||52.6cm2||2.76cm2||4.8mm2|
|Maximum Charge Resolution with High Voltage Interface (HVI)||526mC||526mC||27.6mC||480μC|
|Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI||>100cm2||>100cm2||>100cm2||4.8cm2|
|Maximum Hysteresis Frequency||
270KHz @ 10V
270KHz @ 30V
270KHz @ 100V
100KHz @ 200V
5KHz @ 500V
250KHz @ 10V
50KHz @ 30V
50KHz @ 100V
50KHz @ 200V
2KHz @ 500V
5KHz @ 10V
5KHz @ 30V
5KHz @ 100V
5KHz @ 200V
5KHz @ 500V
|Minimum Hysteresis Frequency||0.03Hz||0.03Hz||0.03Hz||1/8th Hz|
|Minimum Pulse Width||0.5μs||0.5μs||50μs||500μs|
|Minimum Pulse Rise Time (5V)||400ns||400ns||40μs||500μs|
|Maximum Pulse Width||1s||1s||1s||100ms|
|Maximum Delay between Pulses||40ks||40ks||40ks||40ks|
|Minimum Leakage Current (assuming max current integration period = 1 seconds)||2pA||2pA||2pA||10pA|
|Maximum Small Signal Cap Frequency||1MHz||1MHz||20KHz||2KHz|
|Minimum Small Signal Cap Frequency||1Hz||1Hz||1Hz||10Hz|
|Output Rise Time Control||105 scaling||105 scaling||103 scaling||2 settings|
|Electrometer Input All Test Frequencies for all test at any speed||Yes||Yes||Yes||Yes|
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.
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