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Unmatched Performance, Accuracy & Flexibility

Radiant’s entire Precision Line of Materials Analyzers are designed with unmatched performance and flexibility. The Precision tester architecture supports the widest performance envelope, the most versatile test software and the highest signal-to-noise ratio of Ferroelectric and Multiferroic Test Systems on the market. Radiant's Test Systems characterize individual material properties of dielectric response, remanent polarization, piezoelectricity, pyroelectricity, magnetoelectricity, and electrical leakage with no configuration change.

Radiant offers a variety of Precision Test System (entry level systems, process monitoring, reliability testing, and production line testing) configurations to accommodate all levels of research. Vision Data Acquisition Software (included with each Precision Test System) is a revolutionary software package that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment. The type of tester determines the range of voltages, frequencies and sample sizes that Vision may characterize with that tester.

Vision Software offers 155 Tasks in Total. Vision is the only software package available for ferroelectric testers that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment. Vision dramatically increases the productivity of the researcher, reducing the time required to acquire data in an experiment. Vision’s enhanced productivity directly reduces cost of test. Vision dramatically increases the complexity of the research that may be accomplished by allowing researchers to combine different measurement tasks with environmental controls into an automated test procedure managed by programmable logic embedded with automated data collection, analysis and plotting tools.

Complete packages are provided for PiezoMEMS, Ferroelectric, Multiferroic, Piezoelectric, Thermal, Reliability, and Transistor Testing.


Voltage Range (built-in drive voltage) ±10V, ±30V, ±100V, ±200V or ±500V built-in ±10V, ±30V, ±100V, ±200V or ±500V built-in ±10V, ±30V, ±100V, ±200V or ±500V built-in ±200V
Voltage Range with an external amplifier and high voltage interface (HVI) 10KV 10KV 10KV 10KV
Number of ADC Bits 18 18 18 14
Minimum Charge Resolution 0.80fC 0.80fC <10fC 122fC
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) 0.080μ2 0.080μ2 <1μ2 12.2μ2
Maximum Charge Resolution 5.26mC 5.26mC 276μC 4.8μC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) 52.6cm2 52.6cm2 2.76cm2 4.8mm2
Maximum Charge Resolution with High Voltage Interface (HVI) 526mC 526mC 27.6mC 480μC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI >100cm2 >100cm2 >100cm2 4.8cm2
Maximum Hysteresis Frequency 270KHz @ 10V
270KHz @ 30V
270KHz @ 100V
100KHz @ 200V
5KHz @ 500V
250KHz @ 10V
50KHz @ 30V
50KHz @ 100V
50KHz @ 200V
2KHz @ 500V
5KHz @ 10V
5KHz @ 30V
5KHz @ 100V
5KHz @ 200V
5KHz @ 500V
Minimum Hysteresis Frequency 0.03Hz 0.03Hz 0.03Hz 1/8th Hz
Minimum Pulse Width 0.5μs 0.5μs 50μs 500μs
Minimum Pulse Rise Time (5V) 400ns 400ns 40μs 500μs
Maximum Pulse Width 1s 1s 1s 100ms
Maximum Delay between Pulses 40ks 40ks 40ks 40ks
Internal Clock 25ns 25ns 25ns 50μs
Minimum Leakage Current (assuming max current integration period = 1 seconds) 2pA 2pA 2pA 10pA
Maximum Small Signal Cap Frequency 1MHz 1MHz 20KHz 2KHz
Minimum Small Signal Cap Frequency 1Hz 1Hz 1Hz 10Hz
Output Rise Time Control 105 scaling 105 scaling 103 scaling 2 settings
Input Capacitance -6fF -6fF -6fF 1pF
Electrometer Input All Test Frequencies for all test at any speed Yes Yes Yes Yes

* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.

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Multiferroic II Ferroelectric Tester

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Precision LC ll Ferroelectric Tester

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Thousands of Test Systems Installed Worldwide


Dr David Payn

Emeritus Professor of Materials Science and Engineering Department of Materials Science and Engineering

Dr Chang Beom Eom

College of Engineering University of Madison-Wisconsin

Dr. R. Ramesh

Professor - Condensed Matter Experiment and Materials Science & Engineering University of Berkley

Dr. Ali Sayir

Program Manager of High Temperature Aerospace Materials at the Air Force Office of Scientific Research NASA Glenn Research Center

Dr. RK Pandey

Ingram Endowed Professor Ingram School of Engineering Department of Physics Texas State University


Dr. Andrew Bell

BSc, Birmingham, PhD, Leeds, CEng, FIMMM Director of IMR and Professor of Electronic Materials

Dr. James Scott

Nanoscience Centre University of Cambridge

Latin America

Prof. Koduri Ramam

Nanocomposite Lab, Departamento Ingenieria de Materiales Facultad de Ingenieria Universidad de Concepcion, Concepciion, Chile

Dr. Bitra Rajesh Babu

Depto de Ingenieria de Materiales, Facultad de Ingenieria, Universidad de Concepcion, Chile

Dr. Koduri Venkata Surya Ramam

Nanocomposite Lab, Departamento Ingeniería de Materiales, Facultad de Ingeniería, Universidad de Concepcion, Concepcion, Chile

Dr. Bhagavathula Subrahmanya Diwakar


Asia/Middle East

Dr. Husam N. Alshareef

Associate Professor |Materials Science & Engineering Abdullah University of Science & Technology Saudi Arabia

Pro. Li Longtu

Tsinghua University

Pro. Fei Weidong

Harbin university of Science and Technology

Pro. Chen Xianhui

University of Science and Technology of China

Pro. Song You

Nanjing University

Pro. Bao Dinghua

Zhongshan University


Prof. C.N.R.Rao / Dr. A.Sundaresan

Jawarhar Lal Nehru Centre for Advanced Scientific Research

Prof. S.B.Krupanidhi

Materials Research Centre, Indian Institute of Science

Prof. Dhananjai

Pandey School of Marerials Science & Technology, Institute of Technology, Banaras Hindu University

Prof. R.N.P.Chadhury

Dept. of Physics & Meteorology, Indian Institute of Technology

Dr. Surya Mohan

Gupta Laser Materials Division, Raja Ramana Centre for Advance Technology

Dr. Ratnamala Chatterjee

Department of Physics Indian Institute of Technology Delhi