Unmatched performance, accuracy, and flexibility.
Radiant’s entire Precision Line of Materials Analyzers are designed with unmatched performance and flexibility. Radiant’s Test Systems characterize individual material properties of dielectric response, remanent polarization, piezoelectricity, pyroelectricity, magnetoelectricity, and electrical leakage with no configuration change.
Radiant offers a variety of Precision Test System configurations (entry level systems, process monitoring and production line testing) to accommodate all levels of research.
Complete packages are provided for
- PiezoMEMS
- Ferroelectric
- Multiferroic
- Piezoelectric
- Thermal
- Transistor
Precision Multiferroic II
Advanced research
The most advanced test system on the market.
| Built-in drive | ±100V to ±500V |
|---|---|
| ADC bits | 18 |
| Min. charge resolution | 0.80fC |
Precision Premier II
Bulk and thin film
Fine charge resolution for bulk and thin film capacitors.
| Built-in drive | ±10V to ±500V |
|---|---|
| ADC bits | 18 |
| Min. charge resolution | 0.80fC |
Precision LC II
General purpose
An ideal, affordable, general purpose tester.
| Built-in drive | ±10V to ±500V |
|---|---|
| ADC bits | 18 |
| Min. charge resolution | <10fC |
Precision RT66C
Entry level
Easy to set up, flexible, and affordable.
| Built-in drive | ±200V |
|---|---|
| ADC bits | 14 |
| Min. charge resolution | 122fC |
Compare the specifications
| Parameter | Multiferroic II | Premier II | LC II | RT66C |
|---|---|---|---|---|
| Drive voltage | ||||
| Voltage Range (built-in drive voltage) | ±100V, ±200V, or ±500V built-in | ±10V, ±30V, ±100V, ±200V, or ±500V built-in | ±10V, ±30V, ±100V, ±200V, or ±500V built-in | ±200V |
| Voltage Range with an external amplifier and high voltage interface (HVI) | 10KV | 10KV | 10KV | 10KV |
| Charge and area resolution | ||||
| Number of ADC Bits | 18 | 18 | 18 | 14 |
| Minimum Charge Resolution | 0.80fC | 0.80fC | <10fC | 122fC |
| Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm²) | 0.080μ² | 0.080μ² | <1μ² | 12.2μ² |
| Maximum Charge Resolution | 5.26mC | 5.26mC | 276μC | 4.8μC |
| Maximum Area Resolution (assuming saturation polarization = 100μC/cm²) | 52.6cm² | 52.6cm² | 2.76cm² | 4.8mm² |
| Maximum Charge Resolution with High Voltage Interface (HVI) | 526mC | 526mC | 27.6mC | 480μC |
| Maximum Area Resolution (assuming saturation polarization = 100μC/cm²) w/ HVI | >100cm² | >100cm² | >100cm² | 4.8cm² |
| Hysteresis and pulse timing | ||||
| Maximum Hysteresis Frequency** | 270KHz @ ±100V 100KHz @ ±200V 5KHz @ ±500V | 250KHz @ 10V 50KHz @ 30V 50KHz @ 100V 50KHz @ 200V 2KHz @ 500V | 5KHz @ 10V 5KHz @ 30V 5KHz @ 100V 5KHz @ 200V 2KHz @ 500V | 1KHz |
| Minimum Hysteresis Frequency | 0.03Hz | 0.03Hz | 0.03Hz | 1/8th Hz |
| Minimum Pulse Width | 0.5μs | 0.5μs | 50μs | 500μs |
| Minimum Pulse Rise Time (5V) | 400ns | 400ns | 40μs | 500μs |
| Maximum Pulse Width | 1s | 1s | 1s | 100ms |
| Maximum Delay between Pulses | 40ks | 40ks | 40ks | 40ks |
| Internal Clock | 25ns | 25ns | 25ns | 50μs |
| Output Rise Time Control | 105 scaling | 105 scaling | 103 scaling | 2 settings |
| Leakage, small signal, and input | ||||
| Minimum Leakage Current (assuming max current integration period = 1 seconds) | 2pA | 2pA | 12pA | 10pA |
| Maximum Small Signal Cap Frequency | 1MHz | 1MHz | 20KHz | 2KHz |
| Minimum Small Signal Cap Frequency | 1Hz | 1Hz | 1Hz | 10Hz |
| Input Capacitance | ~6fF | ~6fF | ~6fF | 1pF |
| Electrometer Input All Test Frequencies for all test at any speed | Yes | Yes | Yes | Yes |
| Voltage Range (built-in drive voltage) | |||
|---|---|---|---|
| Multiferroic II±100V, ±200V, or ±500V built‑in | Premier II±10V, ±30V, ±100V, ±200V, or ±500V built‑in | LC II±10V, ±30V, ±100V, ±200V, or ±500V built‑in | RT66C±200V |
| Voltage Range with an external amplifier and high voltage interface (HVI) | |||
| Multiferroic II10KV | Premier II10KV | LC II10KV | RT66C10KV |
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
** Maximum hysteresis frequencies apply to the internal amplifier purchased. Voltage ratings are not cumulative: a Multiferroic II purchased with the 500V internal amplifier does not also have the 100V and 200V ratings, as each rating is relative to the internal amplifier purchased.
*** Tester specifications are subject to change without notice.
Vision Software is included with every Precision test system.
Radiant’s Precision Line of Test Systems are driven by Vision Software, with a library of over 150 measurement, analysis, plotting, program control, and documentation tasks.
Combine tests in one run
Chain Hysteresis, PUND, Fatigue, and Leakage in one Test Definition instead of running one test at a time.
Control the environment
Set temperature over GPIB, set the field of a Quantum Design superconducting magnet, and query an LCR meter within the test.
Let the logic decide
Branch tasks repeat steps until a value reaches your threshold; If/Then and Exit tasks skip steps or end the run based on a measured value.
Nothing gets lost
Every run is archived with its Test Definition, so any experiment can be recalled or reproduced.
Documentation and support
A brochure for each tester, the company brochure, and Domain Switching as the Tester Sees It, plus the full knowledge base library.
Thousands of test systems installed worldwide
A selection of the researchers who use Radiant test systems.
USA
- Dr. David Payne
Emeritus Professor of Materials Science and Engineering, University of Illinois at Urbana-Champaign - Dr. Chang Beom Eom
College of Engineering, University of Wisconsin-Madison - Dr. R. Ramesh
Professor, Condensed Matter Experiment and Materials Science & Engineering, University of California, Berkeley - Dr. Ali Sayir
Program Manager of High Temperature Aerospace Materials at the Air Force Office of Scientific Research, NASA Glenn Research Center - Dr. RK Pandey
Ingram Endowed Professor, Ingram School of Engineering, Department of Physics, Texas State University
Europe
- Dr. Andrew Bell
BSc, Birmingham, PhD, Leeds, CEng, FIMMM. Director of IMR and Professor of Electronic Materials, University of Leeds
Latin America
- Dr. Bitra Rajesh Babu
Depto de Ingenieria de Materiales, Facultad de Ingenieria, Universidad de Concepcion, Chile - Dr. Koduri Venkata Surya Ramam
Electrochemical Technologies and Green Energies Laboratory, Departamento de Ingeniería de Materiales, Facultad de Ingeniería, Universidad de Concepcion, Concepcion, Chile - Dr. Bhagavathula Subrahmanya Diwakar
Chile
Asia and Middle East
- Dr. Husam N. Alshareef
Materials Science & Engineering, King Abdullah University of Science & Technology, Saudi Arabia - Prof. Li Longtu
Tsinghua University - Prof. Fei Weidong
Harbin Institute of Technology - Prof. Chen Xianhui
University of Science and Technology of China - Prof. Song You
Nanjing University - Prof. Bao Dinghua
Zhongshan University
India
- Prof. C.N.R. Rao and Dr. A. Sundaresan
Jawaharlal Nehru Centre for Advanced Scientific Research - Prof. S.B. Krupanidhi
Materials Research Centre, Indian Institute of Science - Prof. Dhananjai Pandey
School of Materials Science & Technology, Institute of Technology, Banaras Hindu University - Prof. R.N.P. Choudhary
Dept. of Physics & Meteorology, Indian Institute of Technology Kharagpur - Dr. Surya Mohan Gupta
Laser Materials Division, Raja Ramanna Centre for Advanced Technology - Dr. Ratnamala Chatterjee
Department of Physics, Indian Institute of Technology Delhi