Lake Shore and Radiant - Rapidly Characterize Ferroelectric Devices Over Variable Temperatures 5 K up to 300K

CRX EM HFwithRadiant(1)

Ferroelectric materials are used in a wide variety of applications, including sensors, ferroelectric memory (FeRAM), MEMs devices, actuators, and photovoltaics. Rapid assessment of ferroelectric device characteristics is critical to improving ferroelectric materials processing as well as developing accurate ferroelectric device models. The combination of Radiant ferroelectric test solutions and Lake Shore probe stations offers researchers a flexible platform to efficiently characterize multiple devices in a cryogenic probing environment. The addition of cryogenic temperature characterization can open new frontiers to understanding dielectric properties, switching mechanisms, and fatigue in ferroelectric materials.

Measurements Include

  • 1 Hysteresis vs. temperature
  • 2 Leakage vs. temperature
  • 3 Hysteresis speed vs. temperature
  • 4 Remanent hysteresis vs. temperature
  • 5 PUND remanent polarization vs. temperature
  • 6 PUND frequency response vs. temperature
  • 7 Breakdown voltage vs. temperature
  • 8 IV vs. temperature
  • 9 CV vs. temperature
  • 10 Fatigue vs. temperature
  • 11 Retention vs. temperature
  • 12 Imprint vs. temperature
320 1 Lakeshoregraph(1)

Support Documentation

Related Web Pages

Links coming soon.