Radiant Technologies, A Leader Since 1988

 

Innovative & Creative

 
 
Since its inception in 1988, Radiant Technologies, Inc. has been dedicated to innovating characterization equipment for non volatile memory technologies, non linear electromechanical materials, MEMS, and actuator/sensors.   Radiant pioneered and developed the first ferroelectric test system which quickly became the world-wide industry standard for characterizing non-linear materials.  Precision and accuracy has been the driving force behind the engineering of our test equipment and thin ferroelectric-film-capacitor components.  Radiant designs its testers to minimize distortion and maximize accuracy.
 
Radiant offers a wide range of Precision Test Systems (Multiferroic II, Premier II, LCII, and RT66B) for material research, development and device qualification.  Vision Data Management Software drives Radiant's test systems.  Vision Software allows researchers the simplicity, power and flexibility to take experiments to the next level.  Vision dramatically reduces previously time intensive processes by offering automatic data acquisition, storage, plotting, and data export. 
 
Complete accessory packages for High Voltage Testing to 10kV, Thermal Testing, Piezoelectric, Magnetoelectric, Transistor, and Reliability Testing are provided for each Precision Ferroelectric/Multiferroic Test System.
 

Precision Tester Comparison Chart

 

Tester Parameter

Multiferroic II

 

Premier

 

LC II

RT66B

  Voltage Range (built-in drive voltage)

10V, 30V, 100V, 200V or 500V built-in

10V

  Voltage Range with an external amplifier and high voltage interface (HVI)

10KV

 

10KV

 

10KV

4KV

  Number of ADC Bits

18

18

18

14

  Minimum Charge Resolution

0.80fC

 

0.80fC

 

<10fC

122fC

  Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2)

0.080μ2

0.080μ2

<1μ2

12.2μ2

  Maximum Charge Resolution

5.26mC

 

5.26mC

 

276μC

4.8μC

  Maximum Area Resolution (assuming saturation polarization =
100μC/cm
2)

52.6cm2

52.6cm2

2.76cm2

4.8mm2

  Maximum Charge Resolution with High Voltage Interface (HVI)

526mC

 

526mC

 

27.6mC

480μC

  Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI

>100cm2

>100cm2

>100cm2

4.8cm2

  Maximum Hysteresis Frequency

270KHz @ 10V

 

250KHz @ 10V

 

5KHz @ 10V

0.2KHz

 

270KHz @ 30V

 

50KHz @ 30V

 

5KHz @ 30V

 

 

270KHz @ 100V

 

50KHz @ 100V

 

5KHz @ 100V

 

 

100KHz @ 200V

 

50KHz @ 200V

 

5KHz @ 200V

 

 

5KHz @ 500V

2KHz @ 500V

2KHz @ 500V

 

  Minimum Hysteresis Frequency

0.03Hz

0.03Hz

0.03Hz

0.125Hz

  Minimum Pulse Width

0.5μs

 

0.5μs

 

50μs

500μs

  Minimum Pulse Rise Time (5V)

400ns

400ns

40μs

500μs

  Maximum Pulse Width

1s

 

1s

 

1s

100ms

  Maximum Delay between Pulses

40ks

40ks

40ks

40ks

  Internal Clock

25ns

 

25ns

 

25ns

50μs

Minimum Leakage Current (assuming max current integration period = 1 seconds)

2pA

2pA

2pA

10pA

  Maximum Small Signal Cap Frequency

1MHz

 

1MHz

 

20KHz

2KHz

  Minimum Small Signal Cap Frequency

1Hz

1Hz

1Hz

10Hz

  Output Rise Time Control

105 scaling

 

105 scaling

 

103 scaling

2 settings

  Input Capacitance

-6fF

-6fF

-6fF

1pF

  Electrometer Input All Test Frequencies for all test at any speed

Yes

 

Yes

 

Yes

Yes

* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.
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