Current Installer Version: 5.28.6 Current Installer Date: 20 November 2020
Vision driver 5.28.6 makes internal changes that apply to hardware and controlling software that is under development.
The Sorting Filter Task has added to it the capacity to set Die Row, Die Column and Capacitor ID at runtime.
Sorting Filter Task Instructions are now included in the distribution. No Task Instructions previously existed for the Sorting Filter.
General Changes, discussed over the past few releases are extended to the Sorting Filter and the Check Hysteresis Task.
The Check Hysteresis Task now allows the user to enable the Sample Information dialog to appear at runtime after the Data Presentation dialog is closed. This is primarily for researchers who are measuring samples across a wafer. The dialog allows the Sample Information to be updated and recorded each time the Task executes.
The Check Hysteresis Task Instructions have been updated.
Fix a rare error in Advanced C/V that was reporting the wrong test voltage at each sample point.
Fix an error in General Monopolar that was decoding DRIVE and RETURN data to the wrong scale in some instances..
Update the Hysteresis Task to allow the repair, above, to the General Monopolar Task.
Vision 5.28.2 change suite extended to the Charge Task.
Windows XP and Vista Support Has Ended - Vision 5.27.x cannot be installed under Windows XP or Vista.