Radiant Technologies to Unveil PiezoMEMS Technology at 15th IMF
We are thrilled to announce that Radiant Technologies will be attending the 15th International Meeting on Ferroelectricity (IMF) that will be held from March 26 to March 30 this year in Tel Aviv, Israel, where we will be showcasing our latest development in PiezoMEMS analysis. As leaders in the field of ferroelectric, magnetoelectric, pyroelectric, transistor material, and piezoelectric testing, we are excited to share our latest advancements with other experts in the field.
Diving Deeper into PiezoMEMS Analysis
For our presentation at this year’s event, we’ll describe a powerful new test system with supporting instrumentation, sensors, and software that allows automated testing of complex PiezoMEMS over a wide range of temperatures. The High Resolution/Temperature Angstrom-level Measurement Platform combines a laser doppler vibrometer and an intelligent multiplexer circuit card to analyze the “Device Under Test” in a small temperature chamber or on a probe station. Results from standardized tests will be presented that identify fundamental parameters of PiezoMEMS devices, including the electrical properties of the capacitors which are first evaluated for yield and uniformity.
The High Resolution Angstrom-level Measurement Platform is an exciting step forward for the development and testing of thin film PiezoMEMS devices.
As we prepare for the 15th International Meeting on Ferroelectricity, we hope you share our excitement in unveiling our latest product. With renowned plenary and keynote speakers, as well as a wide range of presentations and discussions, we’re surely in for a treat. Stop by our booth to see our various testers and be sure to attend our presentation – one you definitely won’t want to miss. We look forward to seeing you there!
If you missed Mike McDaniel’s presentation or want to review it, you can download it here: